NFR Polaris S160

NFR Polaris S160 Product Overview

High resolution 2D/3D Imaging for Non-destructive inspection applications

  • Non-invasive, visualization at micron level with sub-micron feature recognition
  • Easy-to-use X-Ray Inspection System
  • Anti-collision design for damage-free inspection
  • Detail detectability down to < 1um
  • Highest magnification of up to 100x (geometric)
  • Slip-ring technology for continuous rotation
  • The sample can be manipulated with 6 axes of freedom
  • NanoFocusRay Co., Ltd. Offers NFR Polaris-S series of sub-micro CT scanners dedicated for high resolution imaging